NASA Technical Reports Server (NTRS) 20130000277: A Framework for R... | |
by NASA Technical Reports Server (NTRS) | |
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Application Specific Integrated Circuit (ASIC) design for | |
space applications involves multiple challenges of | |
maximizing performance, minimizing power and ensuring | |
reliable operation in extreme environments. This is a | |
complex multidimensional optimization problem which must | |
be solved early in the development cycle of a system due | |
to the time required for testing and qualification | |
severely limiting opportunities to modify and iterate. | |
Manual design techniques which generally involve | |
simulation at one or a small number of corners with a | |
very limited set of simultaneously variable parameters in | |
order to make the problem tractable are inefficient and | |
not guaranteed to achieve the best possible results | |
within the performance envelope defined by the process | |
and environmental requirements. What is required is a | |
means to automate design parameter variation, allow the | |
designer to specify operational constraints and | |
performance goals, and to analyze the results in a way | |
which facilitates identifying the tradeoffs defining the | |
performance envelope over the full set of process and | |
environmental corner cases. The system developed by the | |
Mixed Signal ASIC Group (MSAG) at the Goddard Space | |
Flight Center is implemented as framework of software | |
modules, templates and function libraries. It integrates | |
CAD tools and a mathematical computing environment, and | |
can be customized for new circuit designs with only a | |
modest amount of effort as most common tasks are already | |
encapsulated. Customization is required for simulation | |
test benches to determine performance metrics and for | |
cost function computation. Templates provide a starting | |
point for both while toolbox functions minimize the code | |
required. Once a test bench has been coded to optimize a | |
particular circuit, it is also used to verify the final | |
design. The combination of test bench and cost function | |
can then serve as a template for similar circuits or be | |
re-used to migrate the design to different processes by | |
re-running it with the new process specific device | |
models. The system has been used in the design of time to | |
digital converters for laser ranging and time-of-flight | |
mass spectrometry to optimize analog, mixed signal and | |
digital circuits such as charge sensitive amplifiers, | |
comparators, delay elements, radiation tolerant dual | |
interlocked (DICE) flip-flops and two of three voter | |
gates. | |
Date Published: 2016-11-13 11:53:15 | |
Identifier: NASA_NTRS_Archive_20130000277 | |
Item Size: 531562 | |
Language: english | |
Media Type: texts | |
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