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DTIC ADA480358: Metrology for Information Technology
by Defense Technical Information Center
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In May 1996, NIST management requested a white paper on
metrology for information technology (IT). A task group
was formed to develop this white paper with
representatives from the Manufacturing Engineering
Laboratory (MEL), the Information Technology Laboratory
(ITL), and Technology Services (TS). The task group
members had a wide spectrum of experiences and
perspectives on testing and measuring physical and IT
quantities. The task group believed that its collective
experience and knowledge were probably sufficient to
investigate the underlying question of the nature of IT
metrology. During the course of its work, the task group
did not find any previous work addressing the overall
subject of metrology for IT. The task group found it to
be both exciting and challenging to possibly be first in
what should be a continuing area of study. After some
spirited deliberations, the task group was able to reach
consensus on its white paper. Also, as a result of its
deliberations, the task group decided that this white
paper should suggest possible answers rather than assert
definitive conclusions. In this spirit, the white paper
suggests: a scope and a conceptual basis for IT
metrology; a taxonomy for IT methods of testing; status
of IT testing and measurement; opportunities to advance
IT metrology; overall roles for NIST; and recapitulates
the importance of IT metrology to the U.S. The task group
is very appreciative of having had the opportunity to
produce this white paper. The task group hopes that this
white paper will provide food for thought for our
intended audience: NIST management and technical staff
and our colleagues elsewhere who are involved in various
aspects of testing and measuring IT.
Date Published: 2018-06-20 22:18:10
Identifier: DTIC_ADA480358
Item Size: 39726874
Language: english
Media Type: texts
# Topics
DTIC Archive; Carnahan, Lisa; NATIONA...
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